An Automatic Test Circuitry and Test Pattern Generation Method for ASIC
نویسندگان
چکیده
منابع مشابه
Automatic Test Pattern Generation for Digital Circuits
Digital circuits complexity and density are increasing and at the same time it should have more quality and reliability. It leads with high test costs and makes the validation more complex. The main aim is to develop a complete behavioral fault simulation and automatic test pattern generation (ATPG) system for digital circuits modeled in verilog and VHDL. An integrated Automatic Test Generation...
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Due to the rapidly growing size of integrated circuits, there is a need for new algorithms for Automatic Test Pattern Generation (ATPG). While classical algorithms reach their limit, there have been recent advances in algorithms to solve Boolean Satisfiability (SAT). Because Boolean SAT solvers are working on Conjunctive Normal Forms (CNF), the problem has to be transformed. During transformati...
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A method for testing multi-protocol implementation under test (IUT) with a single test suite has been proposed in the literature. It tests a multi-protocol IUT in an integrated way compared to the conventional method, where single-layer test method and single-layer embedded test method are applied separately to the upper layer protocol and lower layer protocol, respectively. However, it did not...
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As the complexity of VLSI circuits is increasing at the rate predicted by Moore's law and the switching frequencies are approaching a gigahertz, testing cost is becoming an important factor in the overall IC manufacturing cost. Testing cost is incurred by test pattern generation and test application processes. In this dissertation, we address both of these factors contributing to the testing co...
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Automatic Test Pattern Generation (ATPG) is one of the core problems in testing of digital circuits. ATPG algorithms based on Boolean Satisfiability (SAT) turned out to be very powerful, due to great advances in the performance of satisfiability solvers for propositional logic in the last two decades. SAT-based ATPG clearly outperforms classical approaches especially for hard-to-detect faults. ...
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ژورنال
عنوان ژورنال: IEEJ Transactions on Electronics, Information and Systems
سال: 1987
ISSN: 0385-4221,1348-8155
DOI: 10.1541/ieejeiss1987.107.12_1101